193-NM LITHOGRAPHY

被引:9
作者
ROTHSCHILD, M
FORTE, AR
HORN, MW
KUNZ, RR
PALMATEER, SC
SEDLACEK, JHC
机构
[1] Lincoln Laboratory, Massachusetts Institute of Technology, Lexington
关键词
D O I
10.1109/2944.473679
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The trend in microelectronics toward printing features 0.25 mu m and below has motivated the development of lithography at the 193-nm wavelength of argon fluoride excimer lasers. This technology is in its early stages, but a picture is emerging of its strengths and limitations. The change in wavelength from 248 to 193 nm will require parallel progress in projection systems, optical materials, and photo-resist chemistries and processes. This paper reviews the current status of these various topics as they have been engineered under a multiyear program at MIT Lincoln Laboratory.
引用
收藏
页码:916 / 923
页数:8
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