MATERIALS FOR BIREFRINGENT COATINGS

被引：5

作者：

WU, Q

HODGKINSON, IJ

机构：

[1] Department of Physics, University of Otago, Dunedin

来源：

APPLIED OPTICS | 1994年 / 33卷 / 34期

关键词：

D O I：

10.1364/AO.33.008109

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We discuss recent developments in methods for monitoring the anisotropic growth and properties of tilted columnar films and present results for the perpendicular incidence birefringence of aluminum oxide, Merck Substance H1, silicon oxide, tantalum oxide, titanium oxide, and zirconium oxide.

引用

页码：8109 / 8110

页数：2

共 5 条

[1] PIE - PERPENDICULAR-INCIDENCE ELLIPSOMETRY-APPLICATION TO DETERMINATION OF OPTICAL-PROPERTIES OF UNIAXIAL AND BIAXIAL ABSORBING CRYSTALS [J].