IN-SITU STUDIES OF EPITAXIAL THIN-FILM GROWTH

[1] [Anonymous], 1928, B SOC FRAN MINER CRI

[2] BASSETT GA, 1958, J I MET, V87, P449

[3] BASSETT GA, 1959, P INT C STRUCT PROP, P11

[4] BASSETT GA, 1960, P EUR REG C ELECTRON, P270

[5] Bauer E., 1958, Z KRISTALLOGR, V110, p[1958, 395], DOI DOI 10.1524/ZKRI.1958.110.1-6.395

[6] Bauer E., 1958, Z KRISTALLOGR, V110, P372, DOI DOI 10.1524/ZKRI.1958.110.1-6.372

[7] BAUER E, 1956, Z KRISTALLOGR, V107, P265

[8] Bruck L, 1936, ANN PHYS-BERLIN, V26, P233

[9] MICROTWINNING IN EPITAXIAL NICKEL-IRON FILMS [J]. PHILOSOPHICAL MAGAZINE, 1960, 5 (52): : 373 - &

[10] APPLICATION OF THE ION BOMBARDMENT CLEANING METHOD TO TITANIUM, GERMANIUM, SILICON, AND NICKEL AS DETERMINED BY LOW-ENERGY ELECTRON DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1958, 29 (08) : 1150 - 1161

[1] [Anonymous], 1928, B SOC FRAN MINER CRI

[2] BASSETT GA, 1958, J I MET, V87, P449

[3] BASSETT GA, 1959, P INT C STRUCT PROP, P11

[4] BASSETT GA, 1960, P EUR REG C ELECTRON, P270

[5] Bauer E., 1958, Z KRISTALLOGR, V110, p[1958, 395], DOI DOI 10.1524/ZKRI.1958.110.1-6.395

[6] Bauer E., 1958, Z KRISTALLOGR, V110, P372, DOI DOI 10.1524/ZKRI.1958.110.1-6.372

[7] BAUER E, 1956, Z KRISTALLOGR, V107, P265

[8] Bruck L, 1936, ANN PHYS-BERLIN, V26, P233

[9] MICROTWINNING IN EPITAXIAL NICKEL-IRON FILMS [J]. PHILOSOPHICAL MAGAZINE, 1960, 5 (52): : 373 - &

[10] APPLICATION OF THE ION BOMBARDMENT CLEANING METHOD TO TITANIUM, GERMANIUM, SILICON, AND NICKEL AS DETERMINED BY LOW-ENERGY ELECTRON DIFFRACTION [J]. JOURNAL OF APPLIED PHYSICS, 1958, 29 (08) : 1150 - 1161