IMAGING OF LA/SR VACANCY DEFECTS IN LA0.8SR0.2MNO3 BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：8

作者：

CERVA, H

机构：

[1] Siemens AG, Research Laboratories, D-81730 Mönchen

来源：

JOURNAL OF SOLID STATE CHEMISTRY | 1995年 / 114卷 / 01期

关键词：

D O I：

10.1006/jssc.1995.1030

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

Defects on (100) planes of La0.8Sr0.2MnO3, approximately 25 nm in size, were investigated by high-resolution transmission electron microscopy (HREM). A systematic comparison of experimental [100] and [110] HREM images of the defects with calculated images for defect models with vacant La/Sr or Mn atom columns was carried out. It turned out that the defects consist of pure La/Sr vacancy defects, one atomic layer thick, with zero cation occupancy. Due to the high density of defects the concentration of La/Sr vacancies corresponds to approximately 1 at% La/Sr. Under the chosen imaging conditions [110] HREM images are sensitive to defects with 75% La/Sr occupancy. (C) 1995 Academic Press, Inc.

引用

页码：211 / 218

页数：8

共 15 条

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