PREPARATION OF STM W-TIPS AND CHARACTERIZATION BY FEM, TEM AND SEM

被引：13

作者：

MENDEZ, J

LUNA, M

BARO, AM

机构：

[1] Departimento de Física de la Materia Condensada C-III, Universidad Autónoma de Madrid

来源：

SURFACE SCIENCE | 1992年 / 266卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(92)91036-B

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We have used an oxygen treatment at high temperature (1300 K) in order to sharpen W tips suitable for STM operation. Starting from an electrochemically etched tip this procedure gives a finger-like tip as can be observed by SEM. We also measure the Fowler-Nordheim plots of field-emitted electrons. Analysis of these data allows a precise characterization of the tip sharpness parameters that we correlate with TEM images.

引用

页码：294 / 298

页数：5

共 11 条

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