ELECTRIC FIELD-INDUCED CHANGES OF W(110) AND W(111) TIPS

被引：16

作者：

NEDDERMEYER, H ^{[1
]}

DRECHSLER, M ^{[1
]}

机构：

[1] CNRS,CRMC2,F-13288 MARSEILLE,FRANCE

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01408.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：459 / 466

页数：8

共 16 条

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[8] MONO-ATOMIC TIPS FOR SCANNING TUNNELING MICROSCOPY
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[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) : 460 - 465
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[J]. JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 347 - 354
[10] ROLE OF TIP STRUCTURE IN SCANNING TUNNELING MICROSCOPY
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[J]. APPLIED PHYSICS LETTERS, 1986, 48 (23) : 1597 - 1599