共 17 条
[2]
Drude P., 1889, ANN PHYS-NEW YORK, V272, P865
[3]
Drude P., 1890, PHYS CHEM, V39, P481, DOI [10.1002/andp.18902750402, DOI 10.1002/ANDP.18902750402]
[4]
Drude P, 1889, ANN PHYS CHEM, V272, P532
[10]
MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY
[J].
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY,
1963, A 67 (04)
:363-+