INTERFACE SCATTERING IN TRIPLE LAYERED POLYCRYSTALLINE THIN AU/X/AU FILMS (X=FE, CO, NI)

被引：14

作者：

DEVRIES, JWC

机构：

[1] Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth

来源：

SOLID STATE COMMUNICATIONS | 1988年 / 65卷 / 03期

关键词：

D O I：

10.1016/0038-1098(88)90888-5

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：201 / 204

页数：4

共 14 条

[1] SIZE EFFECT IN METALLIC SANDWICHES [J].

BERGMANN, G .

PHYSICAL REVIEW B, 1979, 19 (08) :3933-3937

[2] TEMPERATURE-DEPENDENT RESISTIVITY MEASUREMENTS ON POLYCRYSTALLINE SIO2-COVERED THIN GOLD-FILMS [J].

DEVRIES, JWC .

THIN SOLID FILMS, 1987, 150 (2-3) :201-208

[3] RESISTIVITY OF THIN AU FILMS AS A FUNCTION OF GRAIN DIAMETER AND TEMPERATURE [J].

DEVRIES, JWC .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1987, 17 (09) :1945-1952

[4]

DEVRIES JWC, 1987, IN PRESS J PHYS F

[5]

DEVRIES JWC, 1987, UNPUB THIN SOLID FIL

[6] ELECTRONIC TRANSPORT-PROPERTIES OF METALLIC MULTI-LAYER FILMS [J].

DIMMICH, R .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1985, 15 (12) :2477-2487

[7] THE ELECTRICAL CONDUCTANCE OF CONTINUOUS THIN METALLIC DOUBLE-LAYER FILMS [J].

DIMMICH, R ;

WARKUSZ, F .

THIN SOLID FILMS, 1983, 109 (02) :103-114

[8] The conductivity of thin metallic films according to the electron theory of metals [J].

Fuchs, K .

PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108

[9] SURFACE SCATTERING OF ELECTRONS IN METALS [J].

HOFFMANN, H ;

VANCEA, J ;

JACOB, U .

THIN SOLID FILMS, 1985, 129 (3-4) :181-193

[10] ELECTRICAL CONDUCTIVITY OF THIN METALLIC FILMS WITH UNLIKE SURFACES [J].

LUCAS, MSP .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (05) :1632-&

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