HIGH-RESOLUTION SPECTROSCOPY OF SILVER-DOPED SILICON

被引：29

作者：

OLAJOS, J

KLEVERMAN, M

GRIMMEISS, HG

机构：

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.38.10633

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：10633 / 10640

页数：8

共 18 条

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