TRANSMISSION ELECTRON-MICROSCOPY OF GAAS GROWN OVER SUBMICROMETER-PERIOD TUNGSTEN GRATINGS

被引：8

作者：

VOJAK, BA

SALERNO, JP

机构：

来源：

APPLIED PHYSICS LETTERS | 1982年 / 41卷 / 12期

关键词：

D O I：

10.1063/1.93416

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1151 / 1153

页数：3

共 11 条

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