FAST PROGRAMMABLE 256K READ ONLY MEMORY WITH ON-CHIP TEST CIRCUITS

被引：6

作者：

ATSUMI, S

TANAKA, S

SHINADA, K

YOSHIKAWA, K

MAKITA, K

NAGAKUBO, Y

KANZAKI, K

机构：

[1] Toshiba Research & Development, Cent, Kawasaki, Jpn, Toshiba Research & Development Cent, Kawasaki, Jpn

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1985年 / 20卷 / 01期

关键词：

EPROM - FAST PROGRAMMING TIME - LOW POWER CONSUMPTION - ON-CHIP TEST CIRCUITS - READ ONLY MEMORIES;

D O I：

10.1109/JSSC.1985.1052324

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：422 / 427

页数：6

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