LASER MASS-SPECTROMETRY OF POLYGLYCOLS - COMPARISON WITH OTHER MASS-SPECTRAL TECHNIQUES

被引:57
作者
MATTERN, DE [1 ]
HERCULES, DM [1 ]
机构
[1] UNIV PITTSBURGH,DEPT CHEM,PITTSBURGH,PA 15260
关键词
D O I
10.1021/ac00288a008
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
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页码:2041 / 2046
页数:6
相关论文
共 30 条
[1]  
BENNINGHOVEN A, 1984, UNPUB
[2]  
CESARI M, 1966, MAKROMOLEKUL CHEM, V94, P194
[3]   FISSION FRAGMENT IONIZATION MASS-SPECTROMETRY OF POLYETHERS [J].
CHAIT, BT ;
SHPUNGIN, J ;
FIELD, FH .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1984, 58 (JUN) :121-137
[4]   EXTENDED MASS RANGE BY MULTIPLE CHARGE - SAMPLING QUADRUPLY CHARGED QUASI-MOLECULAR IONS OF POLY(ETHYLENE GLYCOL)-4000 [J].
CHAN, KWS ;
COOK, KD .
ORGANIC MASS SPECTROMETRY, 1983, 18 (10) :423-425
[5]   MASS-SPECTROMETRIC STUDY OF INTERACTIONS BETWEEN POLY(ETHYLENE GLYCOLS) AND ALKALI-METALS IN SOLUTION [J].
CHAN, KWS ;
COOK, KD .
MACROMOLECULES, 1983, 16 (11) :1736-1740
[6]  
CHAN KWS, 1983, THESIS U ILLINOIS UR
[7]  
CRAIG AG, 1981, INT J MASS SPECTROM, V38, P297, DOI 10.1016/0020-7381(81)80074-5
[8]   LASER MASS-SPECTROMETRY OF DIQUATERNARY AMMONIUM-SALTS [J].
DANG, TA ;
DAY, RJ ;
HERCULES, DM .
ANALYTICAL CHEMISTRY, 1984, 56 (06) :866-871
[9]   SECONDARY-ELECTRON EMISSION INDUCED BY 5-30-KEV MONATOMIC IONS STRIKING THIN OXIDE-FILMS [J].
DIETZ, LA ;
SHEFFIELD, JC .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) :4361-4370
[10]   SPECTROMETER FOR MEASURING SECONDARY-ELECTRON YIELDS INDUCED BY ION IMPACTS ON THIN-FILM OXIDE SURFACES [J].
DIETZ, LA ;
SHEFFIELD, JC .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (02) :183-191