OFF-NORMAL PHOTO-ELECTRON DIFFRACTION STUDY OF THE C(2X2) SELENIUM OVERLAYER ON NI(001)

被引：27

作者：

ROSENBLATT, DH

KEVAN, SD

TOBIN, JG

DAVIS, RF

MASON, MG

SHIRLEY, DA

TANG, JC

TONG, SY

机构：

[1] UNIV CALIF BERKELEY,DEPT CHEM,BERKELEY,CA 94720

[2] UNIV WISCONSIN,DEPT PHYS,MILWAUKEE,WI 53201

[3] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53201

来源：

PHYSICAL REVIEW B | 1982年 / 26卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.26.3181

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3181 / 3186

页数：6

共 20 条

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[10] SELECTIVE STRUCTURAL SENSITIVITY AND SIMPLIFIED COMPUTATIONS OF ANGLE-RESOLVED ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY [J].

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