FOURIER-TRANSFORM ANALYSIS OF NORMAL PHOTOELECTRON ATTRACTION DATA FOR SURFACE-STRUCTURE DETERMINATION

被引：28

作者：

HUSSAIN, Z

SHIRLEY, DA

LI, CH

TONG, SY

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV MAT & MOLEC RES,BERKELEY,CA 94720

[2] UNIV WISCONSIN,DEPT PHYS,MILWAUKEE,WI 53201

[3] UNIV CALIF BERKELEY,DEPT CHEM,BERKELEY,CA 94720

[4] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53201

来源：

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA-PHYSICAL SCIENCES | 1981年 / 78卷 / 09期

关键词：

D O I：

10.1073/pnas.78.9.5293

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：5293 / 5295

页数：3

共 13 条

[1] NORMAL PHOTOELECTRON DIFFRACTION OF SE 3D LEVEL IN SE OVERLAYERS ON NI(100)
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[3] AZIMUTHAL ANISOTROPY IN DEEP CORE-LEVEL X-RAY PHOTOEMISSION FROM AN ADSORBED ATOM - OXYGEN ON COPPER(001)
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[4] NEW METHOD FOR CALCULATION OF ATOMIC PHASE-SHIFTS - APPLICATION TO EXTENDED X-RAY ABSORPTION FINE-STRUCTURE (EXAFS) IN MOLECULES AND CRYSTALS
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[6] BINDING-SITE DETERMINATION FROM ANGLE-RESOLVED ULTRAVIOLET PHOTOEMISSION INTENSITY MODULATIONS - CLASSIFICATION OF INITIAL STATES INTO 2 TYPES
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[J]. PHYSICAL REVIEW LETTERS, 1979, 42 (14) : 901 - 904
[7] SELECTIVE STRUCTURAL SENSITIVITY AND SIMPLIFIED COMPUTATIONS OF ANGLE-RESOLVED ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY
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[9] IMPROVED EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE (EXAFS) STUDIES APPLIED TO INVESTIGATION OF CU-O, CU-N, AND CU-BR BOND LENGTHS
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[J]. PHYSICAL REVIEW B, 1978, 17 (04): : 1481 - 1488
[10] NORMAL PHOTOELECTRON DIFFRACTION OF C(2X2)O(1S)-NI(001) AND C(2X2)S(2P)-NI(001), WITH FOURIER-TRANSFORM ANALYSIS
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TONG, SY
[J]. PHYSICAL REVIEW B, 1981, 23 (08): : 3828 - 3835

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