ELECTRIC-FIELDS INDUCED IN ALKALI-CONTAINING GLASSES BY ELECTRON-IRRADIATION

被引：2

作者：

MIOTELLO, A ^{[1
]}

机构：

[1] IST RIC SCI & TECNOL,I-38050 POVO,ITALY

来源：

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1986年 / 19卷 / 10期

关键词：

D O I：

10.1088/0022-3719/19/10/002

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：L201 / L206

页数：6

共 9 条

[1] NUMERICAL-ANALYSIS OF FIELD-ASSISTED SODIUM MIGRATION IN ELECTRON-IRRADIATED GLASSES
MIOTELLO, A
MAZZOLDI, P
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1982, 15 (27): : 5615 - 5621
[2] COOPERATIVE TRANSPORT EFFECTS IN ELECTRON-IRRADIATED GLASSES
MIOTELLO, A
MAZZOLDI, P
[J]. PHYSICAL REVIEW LETTERS, 1985, 54 (15) : 1675 - 1678
[3] MOBILITY AND SURFACE RECOMBINATION PROCESSES OF PRIMARY ELECTRONS IN DIELECTRIC SYSTEMS DURING AUGER-ELECTRON SPECTROSCOPY
MIOTELLO, A
[J]. PHYSICS LETTERS A, 1984, 103 (05) : 279 - 282
[4] A NOTE ON ENHANCED DIFFUSION AND DESORPTION PROCESSES IN ELECTRON-IRRADIATED GLASSES
MIOTELLO, A
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1986, 19 (04): : 445 - 452
[5] ALKALI SIGNAL DECAY DURING AUGER ANALYSIS OF DIELECTRIC SOLIDS - SECONDARY EFFECT OF DESORPTION PROCESS
MIOTELLO, A
MAZZOLDI, P
[J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1984, 83 (3-4): : 271 - 277
[6] GENERAL-MODEL OF SODIUM DESORPTION AND DIFFUSION DURING ELECTRON-BOMBARDMENT OF GLASS
OHUCHI, F
HOLLOWAY, PH
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 863 - 867
[7] ELECTRON-BEAM DAMAGE IN AUGER-ELECTRON SPECTROSCOPY
PANTANO, CG
MADEY, TE
[J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 115 - 141
[8] SODIUM-ION MIGRATION IN GLASS ON ELECTRON-BEAM IRRADIATION
USHER, DM
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (14): : 2039 - 2048
[9] ELECTRON TRAPPING IN AMORPHOUS SIO2 STUDIED BY CHARGE BUILDUP UNDER ELECTRON-BOMBARDMENT
VIGOUROUX, JP
DURAUD, JP
LEMOEL, A
LEGRESSUS, C
GRISCOM, DL
[J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (12) : 5139 - 5144

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