CHARACTERIZATION OF DEPLETION-TYPE SURFACE TUNNEL TRANSISTORS

被引:5
作者
UEMURA, T
BABA, T
机构
[1] Fundamental Research Laboratories, NEC Corporation, Tsukuba, Ibaraki, 305
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1992年 / 31卷 / 12B期
关键词
TUNNEL TRANSISTOR; INTERBAND TUNNELING; MODULATION DOPED STRUCTURE; DEPLETION-TYPE; GAAS/ALGAAS; MBE; REGROWTH;
D O I
10.1143/JJAP.31.L1727
中图分类号
O59 [应用物理学];
学科分类号
摘要
A depletion-type Surface Tunnel Transistor (D-STT) is proposed to increase the tunneling current compared to that of the enhancement-type STT (E-STT) previously reported. The most important feature of the D-STT is the use of a modulation doped structure in order to accumulate a high concentration of electrons under the gate. GaAs/AlGaAs D-STTs, which are fabricated by using an MBE regrowth technique, exhibit depletion-mode transistor action with a larger operation current than that displayed by the E-STT. This increase in current is due to a higher two-dimensional electron gas concentration at the i-GaAs surface. Moreover, the high gate leakage current which limits GaAs E-STT operation is reduced in the case of the D-STT by a factor of 10(6).
引用
收藏
页码:L1727 / L1729
页数:3
相关论文
共 5 条
[1]   PROPOSAL FOR SURFACE TUNNEL TRANSISTORS [J].
BABA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1992, 31 (4B) :L455-L457
[2]  
BABA T, 1993, J CRYST GROWTH
[3]   QUANTUM FUNCTIONAL DEVICES - RESONANT-TUNNELING TRANSISTORS, CIRCUITS WITH REDUCED COMPLEXITY, AND MULTIPLE-VALUED LOGIC [J].
CAPASSO, F ;
SEN, S ;
BELTRAM, F ;
LUNARDI, LM ;
VENGURLEKAR, AS ;
SMITH, PR ;
SHAH, NJ ;
MALIK, RJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1989, 36 (10) :2065-2082
[4]   PREDICTION OF TUNNEL DIODE VOLTAGE-CURRENT CHARACTERISTICS [J].
DEMASSA, TA ;
KNOTT, DP .
SOLID-STATE ELECTRONICS, 1970, 13 (02) :131-&
[5]   RESONANT TUNNELING THROUGH QUANTUM WELLS AT FREQUENCIES UP TO 2.5 THZ [J].
SOLLNER, TCLG ;
GOODHUE, WD ;
TANNENWALD, PE ;
PARKER, CD ;
PECK, DD .
APPLIED PHYSICS LETTERS, 1983, 43 (06) :588-590