APPLICATION OF PROTON-INDUCED X-RAY-EMISSION TO QUANTITATIVE TRACE-ELEMENT ANALYSIS

被引：17

作者：

KAJI, H

SHIOKAWA, T

ISHII, K

MORITA, S

KAMIYA, M

SERA, K

TAWARA, H

机构：

[1] TOHOKU UNIV,DEPT CHEM,SENDAI,MIYAGI 980,JAPAN

[2] TOHOKU UNIV,DEPT PHYS,SENDAI,MIYAGI 980,JAPAN

[3] KYUSHU UNIV,DEPT NUCL ENGN,FUKUOKA 812,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS | 1977年 / 142卷 / 1-2期

关键词：

D O I：

10.1016/0029-554X(77)90801-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：21 / 26

页数：6

共 12 条

[1] EXCITATION OF CHARACTERISTIC X RAYS BY PROTONS ELECTRONS + PRIMARY X RAYS
BIRKS, LS
GROSSO, JS
SEEBOLD, RE
BATT, AP
[J]. JOURNAL OF APPLIED PHYSICS, 1964, 35 (09) : 2578 - &
[2] CHU TC, TO BE PUBLISHED
[3] COMPARISON OF PARTICLE AND PHOTON EXCITED X-RAY-FLUORESCENCE APPLIED TO TRACE-ELEMENT MEASUREMENTS OF ENVIRONMENTAL SAMPLES
COOPER, JA
[J]. NUCLEAR INSTRUMENTS & METHODS, 1973, 106 (03): : 525 - 538
[4] SENSITIVITY VERSUS TARGET BACKINGS FOR ELEMENTAL ANALYSIS BY ALPHA EXCITED X-RAY-EMISSION
FLOCCHINI, RG
FEENEY, PJ
SOMMERVILLE, RJ
CAHILL, TA
[J]. NUCLEAR INSTRUMENTS & METHODS, 1972, 100 (03): : 397 - +
[5] GORDON BH, 1971, 5TH P ANN C TRAC SUB
[6] TARGET BACKINGS FOR CHARGED-PARTICLE INDUCED X-RAY-FLUORESCENCE ANALYSIS
HERMAN, AW
MCNELLES, LA
CAMPBELL, JL
[J]. NUCLEAR INSTRUMENTS & METHODS, 1973, 109 (03): : 429 - 437
[7] BREMSSTRAHLUNG INDUCED BY PROTON AND HE-3 ION BOMBARDMENTS IN 1-4-MEV-AMU ENERGY-RANGE
ISHII, K
MORITA, S
TAWARA, H
[J]. PHYSICAL REVIEW A, 1976, 13 (01): : 131 - 138
[8] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL
JOHANSSON, TB
AKSELSSON, R
JOHANSSON, SA
[J]. NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01): : 141 - +
[9] JOHANSSON TB, 1971, LUND7109 NUCL PHYS R
[10] COMPARATIVE STUDY OF ALPHA AND X-RAY INDUCED X-RAY-EMISSION FOR ELEMENTAL ANALYSIS
PERRY, SK
BRADY, FP
[J]. NUCLEAR INSTRUMENTS & METHODS, 1973, 108 (02): : 389 - 396