THE DEVELOPMENT OF SURFACE-TOPOGRAPHY USING 2-ION BEAMS

被引：11

作者：

MAKH, SS

SMITH, R

WALLS, JM

机构：

来源：

JOURNAL OF MATERIALS SCIENCE | 1982年 / 17卷 / 06期

关键词：

D O I：

10.1007/BF00540797

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1689 / 1699

页数：11

共 18 条

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[9] THE DEVELOPMENT OF A GENERAL 3-DIMENSIONAL SURFACE UNDER ION-BOMBARDMENT [J].

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[10] DEVELOPMENT OF SURFACE-TOPOGRAPHY DURING DEPTH PROFILING IN AUGER-ELECTRON SPECTROSCOPY [J].

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