THE DETERMINATION OF LATTICE-PARAMETERS AND STRAINS IN STRESSED THIN-FILMS USING X-RAY-DIFFRACTION WITH SEEMANN-BOHLIN FOCUSING

被引：38

作者：

HAASE, EL

机构：

来源：

THIN SOLID FILMS | 1985年 / 124卷 / 3-4期

关键词：

D O I：

10.1016/0040-6090(85)90278-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：283 / 291

页数：9

共 14 条

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[9] MAGNETOSTRESS EFFECTS IN EVAPORATED NI FILMS [J].

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