THE MEASUREMENT OF THE PROPERTIES OF MATERIALS

被引：226

作者：

AFSAR, MN

BIRCH, JR

CLARKE, RN

CHANTRY, GW

机构：

[1] MIT,FRANCIS BITTER NATL MAGNET LAB,CAMBRIDGE,MA 02139

[2] NATL PHYS LAB,DIV ELECT SCI,RADIO FREQUENCY & MICROWAVE MEASUREMENTS GRP,TEDDINGTON TW11 0LW,MIDDX,ENGLAND

来源：

PROCEEDINGS OF THE IEEE | 1986年 / 74卷 / 01期

关键词：

DIELECTRIC MATERIALS - Measurements - MAGNETIC MATERIALS - Measurements - MATHEMATICAL TRANSFORMATIONS - Fourier Transforms - MICROWAVE MEASUREMENTS;

D O I：

10.1109/PROC.1986.13432

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This review covers approximately 15 years of development of techniques for measuring dielectric properties of materials over the frequency range 1 MHz to 1500 GHz. A summary of the broad development trends is followed by a more detailed description of individual developments. The approaches described include time- and frequency-domain methods; reflection, transmission, and resonant methods; guided and free-space methods; and discrete-frequency and broadband methods, especially Fourier transform spectroscopy. Measurements on magnetic materials are also briefly discussed.

引用

页码：183 / 199

页数：17

共 192 条

[41]

Chamberlain J., 1979, PRINCIPLES INTERFERO

[42]

Chantry G. W., 1971, SUBMILLIMETER SPECTR

[43]

CHANTRY GW, INFRARED MILLIMETRE, V8, P1

[44]

CHARLES RE, 1966, MIT201 LAB INS RES T