LATERAL RESOLUTION OF THE SCANNING TUNNELLING MICROSCOPE

被引：17

作者：

LALOYAUX, T ^{[1
]}

LUCAS, AA ^{[1
]}

VIGNERON, JP ^{[1
]}

LAMBIN, P ^{[1
]}

MORAWITZ, H ^{[1
]}

机构：

[1] IBM,ALMADEN RES CTR,SAN JOSE,CA 95120

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01361.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：53 / 63

页数：11

共 20 条

[1] THEORY OF SCANNING TUNNELING MICROSCOPY METHODS AND APPROXIMATIONS [J].

BARATOFF, A .

PHYSICA B & C, 1984, 127 (1-3) :143-150

[2] TUNNELLING FROM A MANY-PARTICLE POINT OF VIEW [J].

BARDEEN, J .

PHYSICAL REVIEW LETTERS, 1961, 6 (02) :57-&

[3] THEORETICAL DISCUSSION OF THE SCANNING TUNNELING MICROSCOPE [J].

BONO, J ;

GOOD, RH .

SURFACE SCIENCE, 1985, 151 (2-3) :543-552

[4] SPHERICAL TIP MODEL IN THE THEORY OF THE SCANNING TUNNELING MICROSCOPE [J].

CHUNG, MS ;

FEUCHTWANG, TE ;

CUTLER, PH .

SURFACE SCIENCE, 1987, 187 (2-3) :559-568

[5] SCANNING-TUNNELING MICROSCOPY AT SMALL TIP-TO-SURFACE DISTANCES [J].

CIRACI, S ;

BATRA, IP .

PHYSICAL REVIEW B, 1987, 36 (11) :6194-6197

[6] SPATIAL-DISTRIBUTION OF TUNNEL CURRENT AND APPLICATION TO SCANNING-TUNNELING MICROSCOPY - A SEMICLASSICAL TREATMENT [J].

DAS, B ;

MAHANTY, J .

PHYSICAL REVIEW B, 1987, 36 (02) :898-903

[7] MODEL-CALCULATIONS FOR THE TUNNELING CURRENT FROM A TUNGSTEN TIP TO A FLAT AND STEPPED NICKEL (100) SURFACE [J].

DOYEN, G ;

DRAKOVA, D .

SURFACE SCIENCE, 1986, 178 (1-3) :375-381

[8]

Forsythe GE., 1977, COMPUTER METHODS MAT

[9] MODEL-THEORY FOR SCANNING TUNNELING MICROSCOPY - APPLICATION TO AU(110)(1X2) [J].

GARCIA, N ;

OCAL, C ;

FLORES, F .

PHYSICAL REVIEW LETTERS, 1983, 50 (25) :2002-2005

[10]

LALOYAUX T, 1988, IN PRESS J COMP PHYS

← 1 2 →