LATERAL RESOLUTION OF THE SCANNING TUNNELLING MICROSCOPE

被引：17

作者：

LALOYAUX, T ^{[1
]}

LUCAS, AA ^{[1
]}

VIGNERON, JP ^{[1
]}

LAMBIN, P ^{[1
]}

MORAWITZ, H ^{[1
]}

机构：

[1] IBM,ALMADEN RES CTR,SAN JOSE,CA 95120

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01361.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：53 / 63

页数：11

共 20 条

[11] VACUUM TUNNELING CURRENT FROM AN ADSORBED ATOM [J].

LANG, ND .

PHYSICAL REVIEW LETTERS, 1985, 55 (02) :230-233

[12] SPECTROSCOPY OF SINGLE ATOMS IN THE SCANNING TUNNELING MICROSCOPE [J].

LANG, ND .

PHYSICAL REVIEW B, 1986, 34 (08) :5947-5950

[13] FINITE-ELEMENT METHODS IN QUANTUM-MECHANICS [J].

LINDERBERG, J .

COMPUTER PHYSICS REPORTS, 1987, 6 (1-6) :209-242

[14] TUNNELING THROUGH LOCALIZED BARRIERS WITH APPLICATION TO SCANNING TUNNELING MICROSCOPY - NEW SCATTERING THEORETIC APPROACH AND RESULTS [J].

LUCAS, AA ;

MORAWITZ, H ;

HENRY, GR ;

VIGNERON, JP ;

LAMBIN, P ;

CUTLER, PH ;

FEUCHTWANG, TE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :296-299

[15] SCATTERING-THEORETIC APPROACH TO ELASTIC ONE-ELECTRON TUNNELING THROUGH LOCALIZED BARRIERS - APPLICATION TO SCANNING TUNNELING MICROSCOPY [J].

LUCAS, AA ;

MORAWITZ, H ;

HENRY, GR ;

VIGNERON, JP ;

LAMBIN, P ;

CUTLER, PH ;

FEUCHTWANG, TE .

PHYSICAL REVIEW B, 1988, 37 (18) :10708-10720

[16]

LUCAS AA, 1984, J PHYS C SOLID STATE, V9, P125

[17]

MITCHELL AR, 1985, FINITE ELEMENT METHO

[18] CURRENT DISTRIBUTION IN THE SCANNING VACUUM TUNNEL MICROSCOPE - A FREE-ELECTRON MODEL [J].

STOLL, E ;

BARATOFF, A ;

SELLONI, A ;

CARNEVALI, P .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (17) :3073-3086

[19] THEORY OF THE SCANNING TUNNELING MICROSCOPE [J].

TERSOFF, J ;

HAMANN, DR .

PHYSICAL REVIEW B, 1985, 31 (02) :805-813

[20] THEORY AND APPLICATION FOR THE SCANNING TUNNELING MICROSCOPE [J].

TERSOFF, J ;

HAMANN, DR .

PHYSICAL REVIEW LETTERS, 1983, 50 (25) :1998-2001

← 1 2 →