SURFACE DIFFERENTIAL REFLECTIVITY SPECTROSCOPY OF SEMICONDUCTOR SURFACES

被引：96

作者：

SELCI, S ^{[1
]}

CICCACCI, F ^{[1
]}

CHIAROTTI, G ^{[1
]}

CHIARADIA, P ^{[1
]}

CRICENTI, A ^{[1
]}

机构：

[1] CNR,IST STRUTTURA MAT,I-00044 FRASCATI,ITALY

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 03期

关键词：

D O I：

10.1116/1.574154

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：327 / 332

页数：6

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