PROTON SEMI-MICROBEAM DEVICE FOR SURFACE ANALYSIS

被引：31

作者：

BRUNE, D ^{[1
]}

LINDH, U ^{[1
]}

LORENZEN, J ^{[1
]}

机构：

[1] AB ATOMENERGI,STUDSVIK,SWEDEN

来源：

NUCLEAR INSTRUMENTS & METHODS | 1977年 / 142卷 / 1-2期

关键词：

D O I：

10.1016/0029-554X(77)90807-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：51 / 54

页数：4

共 14 条

[1] PROTON-INDUCED X-RAY ANALYSIS OF STEEL SURFACES FOR MICROPROBE PURPOSES [J].

AHLBERG, M ;

AKSELSSON, R ;

BRUNE, D ;

LORENZEN, J .

NUCLEAR INSTRUMENTS & METHODS, 1975, 123 (02) :385-393

[2]

AHLBERG M, IN PRESS

[3]

BRUNE D, 1972, AE451 AB AT REP

[4] PROTON MICROBEAMS, THEIR PRODUCTION AND USE [J].

COOKSON, JA ;

FERGUSON, AT ;

PILLING, FD .

JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1972, 12 (01) :39-52

[5] USE OF FOCUSED ION-BEAMS FOR ANALYSIS [J].

COOKSON, JA ;

PILLING, FD .

THIN SOLID FILMS, 1973, 19 (02) :381-385

[6]

COOKSON JA, 1974, AEREPRNP20 PROGR REP, P50

[7]

COOKSON JA, 1970, AERER6300 HARW REP

[8] SCANNING PROTON-INDUCED X-RAY MICROSPECTROMETRY IN AN ATMOSPHERIC ENVIRONMENT [J].

HOROWITZ, P ;

GRODZINS, L .

SCIENCE, 1975, 189 (4205) :795-797

[9] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL [J].

JOHANSSON, TB ;

AKSELSSON, R ;

JOHANSSON, SA .

NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01) :141-+

[10]

LORENZEN J, 1975, THESIS UPPSALA U

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