X-RAY DIFFRACTOMETER FOR STRUCTURAL STUDIES ON LIQUIDS

被引：10

作者：

ANDONOV, P ^{[1
]}

机构：

[1] UNIV PARIS S,CNRS,LAB PHYS SOLIDES,91405 ORSAY,FRANCE

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1974年 / 9卷 / 05期

关键词：

D O I：

10.1051/rphysap:0197400905090700

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：907 / 923

页数：17

共 64 条

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[3]

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[4]

BRAGG WL, 1930, PHILOS MAG, V7, P823

[5] A correspondence principle in the compton effect [J].

Breit, G .

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[6]

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[7]

Brentano J, 1928, PHILOS MAG, V6, P178

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BRENTANO, JCM .

[10]

BRENTANO JCM, 1935, P PHYS SOC LOND, V47, P932