STUDY OF PHOTOCONDUCTIVE PBTE FILMS BY METHOD OF VARIANCE ANALYSIS OF X-RAY-DIFFRACTION PROFILES

被引：12

作者：

SINHA, NLP ^{[1
]}

SAMANTARY, BK ^{[1
]}

CHAUDHURI, AK ^{[1
]}

BOSE, HN ^{[1
]}

机构：

[1] INDIAN INST TECHNOL, DEPT PHYS, KHARAGPUR 721302, INDIA

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1976年 / 9卷 / 05期

关键词：

D O I：

10.1088/0022-3727/9/5/012

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：795 / 798

页数：4

共 9 条

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[2]

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[3]

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[6] DETERMINATION OF PARTICLE SIZE AND STRAIN IN COLD-WORKED MAGNESIUM BY METHOD OF VARIANCE [J].

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[7] DETERMINATION OF PARTICLE SIZE + STRAIN IN DISTORTED POLYCRYSTALLINE AGGREGATE BY METHOD OF VARIANCE [J].

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[8] BACKGROUND ERRORS IN X-RAY DIFFRACTION PARAMETERS [J].

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[9] VARIANCE AS A MEASURE OF LINE BROADENING IN DIFFRACTOMETRY GENERAL THEORY AND SMALL PARTICLE SIZE [J].

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