SURFACE-ROUGHNESS AND ITS INFLUENCE ON PARTICLE ADHESION USING ATOMIC-FORCE TECHNIQUES

被引:129
作者
SCHAEFER, DM
CARPENTER, M
GADY, B
REIFENBERGER, R
DEMEJO, LP
RIMAI, DS
机构
[1] PURDUE UNIV,DEPT PHYS,W LAFAYETTE,IN 47907
[2] EASTMAN KODAK CO,OFF IMAGING RES & TECHNOL DEV,ROCHESTER,NY 14653
关键词
PARTICLE ADHESION; ATOMIC FORCE MICROSCOPE (AFM); SURFACE FORCE INTERACTION;
D O I
10.1163/156856195X00897
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
The surface force interactions between individual 8 mu m diameter spheres and atomically flat substrates have been investigated using atomic force techniques. The lift-off force of glass, polystyrene, and tin particles from atomically smooth mica and highly oriented pyrolitic graphite substrates was determined as a function of the applied loading force in an inert nitrogen environment. While the relative magnitudes of the measured lift-off force were found to scale as expected between the various systems studied, the absolute values were a factor of similar to 50 smaller than expected from the Johnson, Kendall, and Roberts theory. The surface topography of representative spheres was characterized with atomic force microscopy, allowing a quantitative assessment of the role that surface roughness plays in the adhesion of micrometer-size particles to substrates. Taking into account the radius of curvature of the asperities measured from the atomic force scans, agreement between the measured and theoretical estimates for the lift-off forces was improved, with the corrected experimental forces about a factor of 3 smaller than theoretical expectations.
引用
收藏
页码:1049 / 1062
页数:14
相关论文
共 28 条
[1]   AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].
ALEXANDER, S ;
HELLEMANS, L ;
MARTI, O ;
SCHNEIR, J ;
ELINGS, V ;
HANSMA, PK ;
LONGMIRE, M ;
GURLEY, J .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167
[2]   PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].
BURNHAM, NA ;
DOMINGUEZ, DD ;
MOWERY, RL ;
COLTON, RJ .
PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1931-1934
[3]   A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY [J].
CLEVELAND, JP ;
MANNE, S ;
BOCEK, D ;
HANSMA, PK .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (02) :403-405
[4]   AN EVALUATION OF THE USE OF THE ATOMIC FORCE MICROSCOPE FOR STUDIES IN NANOMECHANICS [J].
COHEN, SR .
ULTRAMICROSCOPY, 1992, 42 :66-72
[5]   ADHESION INDUCED FLOW OF A SOFT POLYESTER-POLYDIMETHYLSILOXANE COPOLYMER SUBSTRATE OVER MICROMETER AND SUBMICROMETER SIZE SPHERICAL-PARTICLES - OBSERVATIONS OF ANOMALOUSLY LARGE MENISCI, INTERPARTICLE BRIDGING AND PARTICLE ENCAPSULATION [J].
DEMEJO, LP ;
RIMAI, DS ;
CHEN, J ;
BOWEN, RC .
JOURNAL OF ADHESION, 1992, 39 (01) :61-74
[6]   EFFECT OF SURFACE-ROUGHNESS ON ADHESION OF ELASTIC SOLIDS [J].
FULLER, KNG ;
TABOR, D .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1975, 345 (1642) :327-342
[7]   SURFACE ENERGY AND CONTACT OF ELASTIC SOLIDS [J].
JOHNSON, KL ;
KENDALL, K ;
ROBERTS, AD .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1971, 324 (1558) :301-&
[8]  
JONES H, 1971, METAL SCI J, V5, P16
[9]  
KINLOCH AJ, 1987, ADHESION ADHESIVES S, P26
[10]  
LYNCH CT, 1975, HDB MATERIALS SCI, V3, P160