TRANSIENT THERMOREFLECTANCE OF THIN METAL-FILMS IN THE PICOSECOND REGIME

被引：21

作者：

MIKLOS, A

LORINCZ, A

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 63卷 / 07期

关键词：

D O I：

10.1063/1.341057

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2391 / 2395

页数：5

共 11 条

[1] SHOT-NOISE-LIMITED DETECTION SCHEME FOR 2-BEAM LASER SPECTROSCOPIES [J].

ANDOR, L ;

LORINCZ, A ;

SIEMION, J ;

SMITH, DD ;

RICE, SA .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (01) :64-67

[2]

Born M., 1975, PRINCIPLES OPTICS, VFifth

[3]

CARLSLAW HS, 1954, CONDUCTION HEAT SOLI

[4] THERMAL-DIFFUSIVITY IN THIN-FILMS MEASURED BY NONCONTACT SINGLE-ENDED PULSED-LASER-INDUCED THERMAL RADIOMETRY [J].

LEUNG, WP ;

TAM, AC .

OPTICS LETTERS, 1984, 9 (03) :93-95

[5] PHOTOTHERMAL DISPLACEMENT SPECTROSCOPY - AN OPTICAL PROBE FOR SOLIDS AND SURFACES [J].

OLMSTEAD, MA ;

AMER, NM ;

KOHN, S ;

FOURNIER, D ;

BOCCARA, AC .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1983, 32 (03) :141-154

[6] THERMAL-WAVE DETECTION AND THIN-FILM THICKNESS MEASUREMENTS WITH LASER-BEAM DEFLECTION [J].

OPSAL, J ;

ROSENCWAIG, A ;

WILLENBORG, DL .

APPLIED OPTICS, 1983, 22 (20) :3169-3176

[7] TRANSIENT THERMOREFLECTANCE FROM METAL-FILMS [J].

PADDOCK, CA ;

EESLEY, GL .

OPTICS LETTERS, 1986, 11 (05) :273-275

[8] TRANSIENT THERMOREFLECTANCE FROM THIN METAL-FILMS [J].

PADDOCK, CA ;

EESLEY, GL .

JOURNAL OF APPLIED PHYSICS, 1986, 60 (01) :285-290

[9] DETECTION OF THERMAL WAVES THROUGH OPTICAL REFLECTANCE [J].

ROSENCWAIG, A ;

OPSAL, J ;

SMITH, WL ;

WILLENBORG, DL .

APPLIED PHYSICS LETTERS, 1985, 46 (11) :1013-1015

[10] PICOSECOND INTERFEROMETRIC-TECHNIQUE FOR STUDY OF PHONONS IN THE BRILLOUIN FREQUENCY-RANGE [J].

THOMSEN, C ;

GRAHN, HT ;

MARIS, HJ ;

TAUC, J .

OPTICS COMMUNICATIONS, 1986, 60 (1-2) :55-58

← 1 2 →