DETERMINATION OF ABSOLUTE PHASE CHANGE ON REFLECTION AT CHROMIUM FILMS

被引:3
作者
HENDERSON, G
WEAVER, C
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D O I
10.1364/JOSA.54.001052
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O4 [物理学];
学科分类号
0702 ;
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页码:1052 / &
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共 9 条
[1]   INTERFEROMETRIC DETERMINATION OF THE APPARENT THICKNESS OF THIN METALLIC FILMS [J].
AVERY, DG .
NATURE, 1949, 163 (4154) :916-916
[2]   Interpretation of the anomalies of the optical constants of thin metal layers. [J].
David, Erwin .
ZEITSCHRIFT FUR PHYSIK, 1939, 114 (7-8) :389-406
[3]  
MALE D, 1950, J PHYS RADIUM, P332
[4]  
PERROT M, 1943, THESIS U MARSIELLES
[5]  
Rouard P., 1937, ANN PHYS, V7, P291
[6]   THE THICKNESS MEASUREMENT OF THIN FILMS BY MULTIPLE BEAM INTERFEROMETRY [J].
SCOTT, GD ;
MCLAUCHLAN, TA ;
SENNETT, RS .
JOURNAL OF APPLIED PHYSICS, 1950, 21 (09) :843-846
[7]  
Tolansky S., 1948, MULTIPLE BEAM INTERF
[8]   PHASE CHANGES ON REFLECTION FROM EVAPORATED CHROMIUM FILMS [J].
WEAVER, C ;
HILL, RM ;
MACLEOD, JES .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1959, 49 (10) :992-997
[9]   MEASUREMENT OF THE THICKNESS OF THIN FILMS BY MULTIPLE-BEAM INTERFERENCE [J].
WEAVER, C ;
BENJAMIN, P .
NATURE, 1956, 177 (4518) :1030-1031