ACCURACY IN MICROANALYSIS BY ELECTRON ENERGY-LOSS SPECTROSCOPY

被引：2

作者：

EGERTON, RF

机构：

[1] State Univ of New York, United States

来源：

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS | 1988年 / 93卷 / 03期

关键词：

D O I：

10.6028/jres.093.082

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：372 / 374

页数：3

共 18 条

BOURDILLON, AJ ;

STOBBS, WM .

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BUGGY, TW .

EGERTON, RF .

[4]

EGERTON RF, 1979, 39TH ANN P EL MICR S, P198

[5] EELS QUANTIFICATION OF M-EDGES BY USING OXIDIC STANDARDS [J].

HOFER, F .

[6]

KUNDMANN MK, 1986, MICROBEAM ANAL 1986, P417

[7]

LEAPMAN RD, 1987, MICROBEAM ANAL 1987, P273

[8]

LIU DR, 1987, 45TH P ANN M EMSA, P118

[9]

MALIS T, 1985, K FACTOR APPROACH EE

[10]

OTTENSMEYER FP, 1986, 11TH P INT C EL MICR, P53