NYQUIST PHASE RELAXATION IN ONE-DIMENSIONAL METAL-FILMS

We have measured the magnetoresistance of narrow (600-1000 angstrom) and thin (150-200 angstrom) gold films, one dimensional with respect to weak localization and electron-electron interaction effects. It is shown that electron-electron collisions with small energy transfer (Nyquist phase-breaking mechanism) govern the phase relaxation in such films over a wide temperature range. The Nyquist time tau(N) was estimated from the magnetoresistance data on the basis of the theoretical dependence DELTAR(loc)(H) that is applicable to the case when Nyquist phase relaxation dominates other phase-breaking proceses. The temperature dependence tau(N)(T) is-proportional-to T-2/3 obtained in this way is in good agreement with the theoretical prediction for one-dimensional conductors.