DETERMINATION OF SILICON UNIT-CELL PARAMETERS BY PRECISION-MEASUREMENTS OF BRAGG PLANE SPACINGS

被引：25

作者：

SIEGERT, H

BECKER, P

SEYFRIED, P

机构：

来源：

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1984年 / 56卷 / 04期

关键词：

D O I：

10.1007/BF01306634

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：273 / 278

页数：6

共 9 条

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