INTERFEROMETRIC DETECTION OF NEAR-INFRARED NONMETAL ATOMIC EMISSION FROM A MICROWAVE-INDUCED PLASMA

被引：21

作者：

FREEMAN, JE ^{[1
]}

HIEFTJE, GM ^{[1
]}

机构：

[1] INDIANA UNIV,DEPT CHEM,BLOOMINGTON,IN 47405

来源：

APPLIED SPECTROSCOPY | 1985年 / 39卷 / 02期

关键词：

D O I：

10.1366/0003702854248818

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：211 / 214

页数：4

共 15 条

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[7] INSTRUMENTATION - ATOMIC SPECTROCHEMICAL MEASUREMENTS WITH A FOURIER-TRANSFORM SPECTROMETER [J].

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