EVALUATION OF A MICROWAVE-INDUCED PLASMA IN HELIUM AT ATMOSPHERIC-PRESSURE AS AN ELEMENT-SELECTIVE DETECTOR FOR GAS-CHROMATOGRAPHY

被引：254

作者：

BEENAKKER, CIM ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1977年 / 32卷 / 3-4期

关键词：

D O I：

10.1016/0584-8547(77)80004-9

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：173 / 187

页数：15

共 33 条

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