ASPECTS OF HIGH-RESOLUTION IMAGING WITH A SCANNING ION MICROPROBE

被引：60

作者：

LEVISETTI, R ^{[1
]}

CHABALA, JM ^{[1
]}

WANG, YL ^{[1
]}

机构：

[1] UNIV CHICAGO,DEPT PHYS,CHICAGO,IL 60637

来源：

ULTRAMICROSCOPY | 1988年 / 24卷 / 2-3期

关键词：

D O I：

10.1016/0304-3991(88)90304-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：97 / 113

页数：17

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