COMPARISON OF TECHNIQUES FOR MEASURING THE ROUGHNESS OF OPTICAL-SURFACES

被引:46
作者
BENNETT, JM
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D O I
10.1117/12.7973493
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
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页码:380 / 387
页数:8
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共 25 条
[1]   SCATTERING FROM INFRARED MISSILE DOMES [J].
ARCHIBALD, PC ;
BENNETT, HE .
OPTICAL ENGINEERING, 1978, 17 (06) :647-651
[2]  
Beckmann P., 1963, SCATTERING ELECTROMA
[3]   RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCE [J].
BENNETT, HE ;
PORTEUS, JO .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (02) :123-+
[4]   SCATTERING CHARACTERISTICS OF OPTICAL-MATERIALS [J].
BENNETT, HE .
OPTICAL ENGINEERING, 1978, 17 (05) :480-488
[5]   MEASUREMENT OF RMS ROUGHNESS, AUTOCOVARIANCE FUNCTION AND OTHER STATISTICAL PROPERTIES OF OPTICAL SURFACES USING A FECO SCANNING INTERFEROMETER [J].
BENNETT, JM .
APPLIED OPTICS, 1976, 15 (11) :2705-2721
[6]   STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES [J].
BENNETT, JM ;
DANCY, JH .
APPLIED OPTICS, 1981, 20 (10) :1785-1802
[7]   LOW-SCATTER MOLYBDENUM SURFACES [J].
BENNETT, JM ;
ARCHIBALD, PC ;
RAHN, JP ;
KLUGMAN, A .
APPLIED OPTICS, 1983, 22 (24) :4048-4055
[8]  
BENNETT JM, 1984, ASTM2A44 DOC
[9]  
BENNETT JM, 1981, DEC WORKSH OPT FABR
[10]  
CHURCH EL, 1984, P SOC PHOTO-OPT INST, V508, P71, DOI 10.1117/12.944964