共 25 条
[2]
Beckmann P., 1963, SCATTERING ELECTROMA
[4]
SCATTERING CHARACTERISTICS OF OPTICAL-MATERIALS
[J].
OPTICAL ENGINEERING,
1978, 17 (05)
:480-488
[5]
MEASUREMENT OF RMS ROUGHNESS, AUTOCOVARIANCE FUNCTION AND OTHER STATISTICAL PROPERTIES OF OPTICAL SURFACES USING A FECO SCANNING INTERFEROMETER
[J].
APPLIED OPTICS,
1976, 15 (11)
:2705-2721
[6]
STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES
[J].
APPLIED OPTICS,
1981, 20 (10)
:1785-1802
[8]
BENNETT JM, 1984, ASTM2A44 DOC
[9]
BENNETT JM, 1981, DEC WORKSH OPT FABR
[10]
CHURCH EL, 1984, P SOC PHOTO-OPT INST, V508, P71, DOI 10.1117/12.944964