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THE INFLUENCE OF HYDROGEN-ION BOMBARDMENT ON THE PHOTO-VOLTAIC PROPERTIES OF CU/CU2O SCHOTTKY-BARRIER SOLAR-CELLS
被引:7
作者
:
IWANOWSKI, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
WAYNE STATE UNIV,DEPT CHEM,DETROIT,MI 48202
WAYNE STATE UNIV,DEPT CHEM,DETROIT,MI 48202
IWANOWSKI, RJ
[
1
]
TRIVICH, D
论文数:
0
引用数:
0
h-index:
0
机构:
WAYNE STATE UNIV,DEPT CHEM,DETROIT,MI 48202
WAYNE STATE UNIV,DEPT CHEM,DETROIT,MI 48202
TRIVICH, D
[
1
]
机构
:
[1]
WAYNE STATE UNIV,DEPT CHEM,DETROIT,MI 48202
来源
:
RADIATION EFFECTS LETTERS
|
1983年
/ 76卷
/ 03期
关键词
:
D O I
:
10.1080/01422448308209643
中图分类号
:
TL [原子能技术];
O571 [原子核物理学];
学科分类号
:
0827 ;
082701 ;
摘要
:
引用
收藏
页码:87 / 92
页数:6
相关论文
共 5 条
[1]
STUDIES OF TUNNEL MOS DIODES .1. INTERFACE EFFECTS IN SILICON SCHOTTKY DIODES
CARD, HC
论文数:
0
引用数:
0
h-index:
0
CARD, HC
RHODERICK, EH
论文数:
0
引用数:
0
h-index:
0
RHODERICK, EH
[J].
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1971,
4
(10)
: 1589
-
+
[2]
FISH DL, 1982, THESIS WAYNE STATE U
[3]
SZE SM, 1981, PHYSICS SEMICONDUCTO
[4]
Trivich D., 1976, Twelfth IEEE Photovoltaic Specialists Conference 1976, P875
[5]
TRIVICH D, 1982, 16TH P IEEE PHOT SPE
←
1
→
共 5 条
[1]
STUDIES OF TUNNEL MOS DIODES .1. INTERFACE EFFECTS IN SILICON SCHOTTKY DIODES
CARD, HC
论文数:
0
引用数:
0
h-index:
0
CARD, HC
RHODERICK, EH
论文数:
0
引用数:
0
h-index:
0
RHODERICK, EH
[J].
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1971,
4
(10)
: 1589
-
+
[2]
FISH DL, 1982, THESIS WAYNE STATE U
[3]
SZE SM, 1981, PHYSICS SEMICONDUCTO
[4]
Trivich D., 1976, Twelfth IEEE Photovoltaic Specialists Conference 1976, P875
[5]
TRIVICH D, 1982, 16TH P IEEE PHOT SPE
←
1
→