TRANSIENT THERMAL RESPONSE MEASUREMENTS OF POWER TRANSISTORS

被引：61

作者：

BLACKBURN, DL ^{[1
]}

OETTINGER, FF ^{[1
]}

机构：

[1] NBS,INST APPL TECHNOL,ELECTR TECHNOL DIV,WASHINGTON,DC 20234

来源：

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS AND CONTROL INSTRUMENTATION | 1975年 / IE22卷 / 02期

关键词：

D O I：

10.1109/TIECI.1975.351241

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 [计算机科学与技术];

摘要：

引用

页码：134 / 141

页数：8

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[10]

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