COMPUTER EXPERIMENTS FOR TILTED BEAM DARK-FIELD IMAGING

被引：18

作者：

KRAKOW, W ^{[1
]}

机构：

[1] XEROX CORP,ROCHESTER,NY 14644

来源：

ULTRAMICROSCOPY | 1976年 / 1卷 / 03期

关键词：

Compendex;

D O I：

10.1016/0304-3991(76)90035-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

IMAGING TECHNIQUES

引用

页码：203 / 221

页数：19

共 30 条

[21] IMAGE-PROCESSING OF DARK-FIELD ELECTRON MICROGRAPHS [J].

KRAKOW, W ;

WELLES, KB ;

SIEGEL, BM .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (02) :175-+

[22]

KRAKOW W, TO BE PUBLISHED

[23]

KRAKOW W, UNPUBLISHED RESULTS

[24]

KRAKOW W, 1975, 33 P ANN M EL MICR S, P200

[25] IMAGE RESOLUTION AND IMAGE CONTRAST IN ELECTRON-MICROSCOPE .3. INELASTIC-SCATTERING AND COHERENT ILLUMINATION [J].

MISELL, DL ;

ATKINS, AJ .

JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 1973, 6 (02) :218-235

[26] ELECTRON-MICROSCOPY OF BIOLOGICAL SPECIMENS [J].

MISELL, DL .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1973, 6 (01) :L1-L5

[27] IMAGE OF A SULFUR ATOM [J].

OTTENSMEYER, FP ;

SCHMIDT, EE ;

OLBRECHT, AJ .

SCIENCE, 1973, 179 (4069) :175-176

[28] MOLECULAR ARCHITECTURE - OPTICAL TREATMENT OF DARK FIELD ELECTRON MICROGRAPHS OF ATOMS [J].

OTTENSMEYER, FP ;

SCHMIDT, EE ;

POWELL, J ;

JACK, T .

JOURNAL OF ULTRASTRUCTURE RESEARCH, 1972, 40 (5-6) :546-+

[29] DARK FIELD IMAGES OF AMORPHOUS CARBON FILMS IN HIGH RESOLUTION ELECTRON MICROSCOPY [J].

TANAKA, M .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1971, 10 (02) :274-&

[30]

WELLES K, 1974, 8TH P INT C EL MICR, V1, P320

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