SOLID BREAKDOWN PROCESS FROM VIEWPOINT OF NATURE OF PREBREAKDOWN CURRENT IN POLYMERIC INSULATING MATERIALS

被引：10

作者：

HIKITA, M ^{[1
]}

KANNO, I ^{[1
]}

SAWA, G ^{[1
]}

IEDA, M ^{[1
]}

机构：

[1] MIE UNIV,DEPT ELECTR,TSU,MIE 514,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1985年 / 24卷 / 12期

关键词：

D O I：

10.1143/JJAP.24.1619

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1619 / 1622

页数：4

共 11 条

[1] NEW APPROACH TO BREAKDOWN STUDY BY MEASURING PRE-BREAKDOWN CURRENT IN INSULATING MATERIALS [J].

HIKITA, M ;

TAJIMA, S ;

KANNO, I ;

SAWA, G ;

IEDA, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1984, 23 (12) :L886-L888

[2] HIGH-FIELD CONDUCTION AND ELECTRICAL BREAKDOWN OF POLYETHYLENE AT HIGH-TEMPERATURES [J].

HIKITA, M ;

TAJIMA, S ;

KANNO, I ;

ISHINO, I ;

SAWA, G ;

IEDA, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (08) :988-996

[3] CONSIDERATION ON FILAMENTARY THERMAL BREAKDOWN BY MEASURING PRE-BREAKDOWN CURRENT IN SOLID DIELECTRICS [J].

HIKITA, M ;

KANNO, I ;

SAWA, G ;

IEDA, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (08) :984-987

[4] ELECTRICAL BREAKDOWN AND SOLID STRUCTURE OF POLY(VINYLIDENE-FLUORIDE) [J].

HIKITA, M ;

SAWA, G ;

IEDA, M .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1983, 16 (08) :L157-L161

[5]

INUSHI Y, 1957, J APPL PHYS, V28, P1017

[6]

KITANI I, 1974, T I ELECT ENG JAPA A, V94, P251

[7]

MIYAIRI K, 1971, J I ELECT ENG JPN, V91, P1962

[8]

MIYAIRI K, 1983, 1ST P INT C COND BRE, P428

[9] ON THE THEORY OF ELECTRON MULTIPLICATION IN CRYSTALS [J].

SEITZ, F .

PHYSICAL REVIEW, 1949, 76 (09) :1376-1393

[10] FILAMENTARY THERMAL BREAKDOWN IN THIN DIELECTRICS [J].

SHOUSHA, AHM ;

YOUNG, L ;

PULFREY, DL .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (01) :15-&

← 1 2 →