GETTERING OF MOBILE OXYGEN AND DEFECT STABILITY WITHIN BACK-SURFACE DAMAGE REGIONS IN SI - COMMENT

被引:2
作者
SCHAAKE, HF
机构
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.330532
中图分类号
O59 [应用物理学];
学科分类号
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页码:1226 / 1226
页数:1
相关论文
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  • [1] GETTERING OF MOBILE OXYGEN AND DEFECT STABILITY WITHIN BACK-SURFACE DAMAGE REGIONS IN SI
    MAGEE, TJ
    LEUNG, C
    KAWAYOSHI, H
    [J]. APPLIED PHYSICS LETTERS, 1981, 38 (11) : 891 - 893
  • [2] PATEL JR, 1981, SEMICONDUCTOR SILICO, P191
  • [3] SWALIN RA, 1962, THERMODYNAMICS SOLID, P84
  • [4] YARWOOD J, 1967, HIGH VACUUM TECHNIQU, P5