LOW RESISTIVITY INDIUM TIN OXIDE TRANSPARENT CONDUCTIVE FILMS .2. EFFECT OF SPUTTERING VOLTAGE ON ELECTRICAL PROPERTY OF FILMS

被引:273
作者
ISHIBASHI, S
HIGUCHI, Y
OTA, Y
NAKAMURA, K
机构
[1] Institute for Super Materials, ULVACJAPAN. Ltd, Sanbu, Chiba, 289-12
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 03期
关键词
D O I
10.1116/1.576890
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A low resistivity and high transmittance Sn doped In2O3 (ITO) film was formed on a glass substrate by dc magnetron sputtering and lower sputtering voltage gave a lower resistivity film. At a sputtering voltage of — 250 V, the resistivity obtained was 5.0x10−4Ω cm for room temperature substrate, 2.0x10 −4Ωcm for 160°C substrate, 1.9X10−4Ω cm for 200°C substrate, and 1.2 × 10 −4Ω cm for 460 °C substrate. At a sputtering voltage of —80 V, the resistivity was 1.3 × 10−4Ω cm for 200 °C substrate. A measurement of Hall effect shows that the decreased resistivity by lower sputtering voltage is not caused by the Hall mobility but by an increased carrier concentration. © 1990, American Vacuum Society. All rights reserved.
引用
收藏
页码:1403 / 1406
页数:4
相关论文
共 4 条
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