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DOMINANT PINNING MECHANISMS IN YBA2CU3O7-X FILMS ON SINGLE AND POLYCRYSTALLINE YTTRIA STABILIZED ZIRCONIA SUBSTRATES
被引:6
作者:
HARSHAVARDHAN, KS
RAJESWARI, M
HWANG, DM
CHEN, CY
SANDS, T
VENKATESAN, T
TKACZYK, JE
LAY, KW
SAFARI, A
机构:
[1] UNIV MARYLAND,DEPT PHYS,CTR SUPERCOND RES,COLLEGE PK,MD 20742
[2] GE,CORP RES & DEV,SCHENECTADY,NY 12301
[3] RUTGERS STATE UNIV,DEPT CERAM ENGN,NEW BRUNSWICK,NJ 08855
[4] UNIV MARYLAND,DEPT ELECT ENGN,COLLEGE PK,MD 20742
关键词:
D O I:
10.1063/1.107148
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Critical-current densities have been measured in YBa2Cu3O7-x films deposited on (100) yttria stabilized zirconia (YSZ) and polycrystalline YSZ substrates as a function of temperature (4.5-88 K), magnetic field (0-1 T) and orientation relative to the applied field. The results indicate that in films on polycrystalline substrates, surface and interface pinning play a dominant role at high temperatures. In films on (100) YSZ, pinning is mainly due to intrinsic layer pinning as well as extrinsic pinning associated with the interaction of the fluxoids with point defects and low energy planar (2D) boundaries. The differences are attributed to the intrinsic rigidity of single fluxoids which is reduced in films on polycrystalline substrates thereby weakening the intrinsic layer pinning.
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页码:1902 / 1904
页数:3
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