OPTICALLY TRAPPED NONLINEAR PARTICLES AS PROBES FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY

被引：9

作者：

HERTZ, HM ^{[1
]}

MALMQVIST, L ^{[1
]}

ROSENGREN, L ^{[1
]}

LJUNGBERG, K ^{[1
]}

机构：

[1] UNIV UPPSALA,DEPT TECHNOL,S-75121 UPPSALA,SWEDEN

来源：

ULTRAMICROSCOPY | 1995年 / 57卷 / 2-3期

关键词：

D O I：

10.1016/0304-3991(94)00158-J

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We use the frequency doubled light from an optically trapped lithium niobate particle for non-intrusive scanning near-field optical microscopy. The detected power from this 50-100 nm diameter probe is currently tens of pW and is expected to approach nW with an improved detection system. The current experimental resolution is approximately 0.5 mu m, while the ultimate theoretical resolution is 70-90 nm. An acoustic trap which potentially allows higher resolution imaging is briefly described.

引用

页码：309 / 312

页数：4

共 15 条

[1]

[Anonymous], 1992, INTERMOLECULAR SURFA

[2] OBSERVATION OF A SINGLE-BEAM GRADIENT FORCE OPTICAL TRAP FOR DIELECTRIC PARTICLES [J].