COMPARISON OF THE PROPERTIES OF TITANIUM-DIOXIDE FILMS PREPARED BY VARIOUS TECHNIQUES

[1] MULTIPLE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS [J]. APPLIED OPTICS, 1984, 23 (20): : 3571 - 3596

[2] STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES [J]. APPLIED OPTICS, 1981, 20 (10): : 1785 - 1802

[3] AUTOMATIC-DETERMINATION OF THE OPTICAL-CONSTANTS OF INHOMOGENEOUS THIN-FILMS [J]. APPLIED OPTICS, 1982, 21 (22): : 4020 - 4029

[4] AN IMPROVED METHOD FOR THE DETERMINATION OF THE EXTINCTION COEFFICIENT OF THIN-FILM MATERIALS [J]. THIN SOLID FILMS, 1983, 102 (03) : 209 - 220

[5] EXACT EXPRESSIONS FOR CALCULATING THIN-FILM ABSORPTION-COEFFICIENTS FROM LASER CALORIMETRIC DATA [J]. APPLIED OPTICS, 1984, 23 (17): : 2886 - 2891

[6] RELATION BETWEEN THE ANGULAR-DEPENDENCE OF SCATTERING AND THE STATISTICAL PROPERTIES OF OPTICAL-SURFACES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (01) : 31 - 47

[7] Emiliani G., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V652, P153, DOI 10.1117/12.938372

[8] ATTRACTIVE FORCES AT INTERFACES [J]. INDUSTRIAL AND ENGINEERING CHEMISTRY, 1964, 56 (12): : 40 - &

[9] FRIEDRICH DM, 1988, NBS SPEC PUBL, V746, P374

[10] MORPHOLOGY AND LIGHT-SCATTERING OF DIELECTRIC MULTILAYER SYSTEMS [J]. THIN SOLID FILMS, 1976, 34 (02) : 363 - 367

[1] MULTIPLE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS [J]. APPLIED OPTICS, 1984, 23 (20): : 3571 - 3596

[2] STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES [J]. APPLIED OPTICS, 1981, 20 (10): : 1785 - 1802

[3] AUTOMATIC-DETERMINATION OF THE OPTICAL-CONSTANTS OF INHOMOGENEOUS THIN-FILMS [J]. APPLIED OPTICS, 1982, 21 (22): : 4020 - 4029

[4] AN IMPROVED METHOD FOR THE DETERMINATION OF THE EXTINCTION COEFFICIENT OF THIN-FILM MATERIALS [J]. THIN SOLID FILMS, 1983, 102 (03) : 209 - 220

[5] EXACT EXPRESSIONS FOR CALCULATING THIN-FILM ABSORPTION-COEFFICIENTS FROM LASER CALORIMETRIC DATA [J]. APPLIED OPTICS, 1984, 23 (17): : 2886 - 2891

[6] RELATION BETWEEN THE ANGULAR-DEPENDENCE OF SCATTERING AND THE STATISTICAL PROPERTIES OF OPTICAL-SURFACES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (01) : 31 - 47

[7] Emiliani G., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V652, P153, DOI 10.1117/12.938372

[8] ATTRACTIVE FORCES AT INTERFACES [J]. INDUSTRIAL AND ENGINEERING CHEMISTRY, 1964, 56 (12): : 40 - &

[9] FRIEDRICH DM, 1988, NBS SPEC PUBL, V746, P374

[10] MORPHOLOGY AND LIGHT-SCATTERING OF DIELECTRIC MULTILAYER SYSTEMS [J]. THIN SOLID FILMS, 1976, 34 (02) : 363 - 367