共 31 条
[3]
Azzam RMA, 1977, ELLIPSOMETRY POLARIZ
[4]
Bennet H.E., 1967, PHYS THIN FILMS, V4, P1
[5]
SCATTERING CHARACTERISTICS OF OPTICAL-MATERIALS
[J].
OPTICAL ENGINEERING,
1978, 17 (05)
:480-488
[6]
STRUCTURE-RELATED OPTICAL CHARACTERISTICS OF THIN METALLIC-FILMS IN VISIBLE AND ULTRAVIOLET
[J].
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY,
1976, 80 (04)
:643-658
[7]
COMPUTATIONAL METHOD FOR DETERMINING N AND K FOR THIN FILM FROM MEASURED REFLECTANCE TRANSMITTANCE AND FILM THICKNESS
[J].
APPLIED OPTICS,
1966, 5 (01)
:41-&
[8]
MEASUREMENT OF RMS ROUGHNESS, AUTOCOVARIANCE FUNCTION AND OTHER STATISTICAL PROPERTIES OF OPTICAL SURFACES USING A FECO SCANNING INTERFEROMETER
[J].
APPLIED OPTICS,
1976, 15 (11)
:2705-2721
[9]
STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES
[J].
APPLIED OPTICS,
1981, 20 (10)
:1785-1802
[10]
BENNETT JM, 1983, J OPT SOC AM, V73, P1865