Magnetron sputter epitaxy of Si/Ge heterostructures

被引:4
作者
Sutter, P
Muller, E
Tao, S
Schwarz, C
Filzmoser, M
Lenz, M
vonKanel, H
机构
[1] Laboratorium für Festkörperphysik, Eidgenössische Technische Hochschule
关键词
D O I
10.1016/0022-0248(95)00384-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Radio-frequency magnetron sputter epitaxy was employed for the synthesis of SimGen/Si(001) strained-layer superlattices and of modulation doped, strained Si quantum wells on relaxed Si0.7Ge0.3. Raman spectroscopy was used to demonstrate that the Ge layers of a Si30Ge6/Si(001) superlattice are fully strained and that surprisingly sharp Si/Ge interfaces of similar to 2-4 ML extension result from the sputter epitaxy. Magnetotransport measurements on Si quantum well structures at T = 1.6 K proved the presence of a two-dimensional electron gas with a mobility of 15 800 cm(2) V-1 s(-1) and allowed the observation of the integer quantum Hall effect.
引用
收藏
页码:172 / 176
页数:5
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