SECONDARY ION MASS-SPECTROMETRY (SIMS) OF METAL-HALIDES .4. THE ENVELOPES OF SECONDARY CLUSTER ION DISTRIBUTIONS

被引:46
作者
CAMPANA, JE
DUNLAP, BI
机构
来源
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1984年 / 57卷 / 01期
关键词
D O I
10.1016/0168-1176(84)85069-7
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
引用
收藏
页码:103 / 123
页数:21
相关论文
共 61 条
[1]  
BARBER M, 1982, ANAL CHEM, V54, pA645
[2]  
Barlak T. M., 1983, Journal of Physical Chemistry, V87, P3441, DOI 10.1021/j100241a018
[3]   SECONDARY ION MASS-SPECTROMETRY OF METAL-SALTS - POLYATOMIC ION EMISSION [J].
BARLAK, TM ;
CAMPANA, JE ;
WYATT, JR ;
DUNLAP, BI ;
COLTON, RJ .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 46 (JAN) :523-526
[4]   SECONDARY ION MASS-SPECTROMETRY OF METAL-HALIDES .2. EVIDENCE FOR STRUCTURE IN ALKALI IODIDE CLUSTERS [J].
BARLAK, TM ;
WYATT, JR ;
COLTON, RJ ;
DECORPO, JJ ;
CAMPANA, JE .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1982, 104 (05) :1212-1215
[5]  
BARLAK TM, 1981, J PHYS CHEM-US, V85, P3850
[6]  
BARLAK TM, 1981, UNPUB
[7]  
BENNINGHOVEN A, 1982, SECONDARY ION MASS S, V3, P438
[8]   HYDROGEN CLUSTER IONS [J].
BEUHLER, RJ ;
FRIEDMAN, L .
PHYSICAL REVIEW LETTERS, 1982, 48 (16) :1097-1099
[9]   SPUTTERING AND CHUNK EJECTION FROM UO2 AND METALLIC LAYERS DEPOSITED ON UO2 [J].
BIERSACK, JP ;
FINK, D ;
MERTENS, P .
JOURNAL OF NUCLEAR MATERIALS, 1974, 53 (01) :194-200
[10]   LOCALIZED TIME-DEPENDENT PERTURBATIONS IN METALS - FORMALISM AND SIMPLE EXAMPLES [J].
BLANDIN, A ;
NOURTIER, A ;
HONE, DW .
JOURNAL DE PHYSIQUE, 1976, 37 (04) :369-378