SECONDARY ION MASS-SPECTROMETRY OF METAL-SALTS - POLYATOMIC ION EMISSION

被引：45

作者：

BARLAK, TM

CAMPANA, JE

WYATT, JR

DUNLAP, BI

COLTON, RJ

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1983年 / 46卷 / JAN期

关键词：

D O I：

10.1016/0020-7381(83)80167-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：523 / 526

页数：4

共 12 条

[1] SECONDARY ION MASS-SPECTROMETRY OF METAL-HALIDES .1. STABILITY OF ALKALI IODIDE CLUSTERS [J].

BARLAK, TM ;

CAMPANA, JE ;

COLTON, RJ ;

DECORPO, JJ ;

WYATT, JR .

JOURNAL OF PHYSICAL CHEMISTRY, 1981, 85 (25) :3840-3844

[2] SECONDARY ION MASS-SPECTROMETRY OF METAL-HALIDES .2. EVIDENCE FOR STRUCTURE IN ALKALI IODIDE CLUSTERS [J].

BARLAK, TM ;

WYATT, JR ;

COLTON, RJ ;

DECORPO, JJ ;

CAMPANA, JE .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1982, 104 (05) :1212-1215

[3]

BARLAK TM, UNPUB

[4] EFFECT OF CLUSTER SURFACE ENERGIES ON SECONDARY-ION-INTENSITY DISTRIBUTIONS FROM IONIC-CRYSTALS [J].

CAMPANA, JE ;

BARLAK, TM ;

COLTON, RJ ;

DECORPO, JJ ;

WYATT, JR ;

DUNLAP, BI .

PHYSICAL REVIEW LETTERS, 1981, 47 (15) :1046-1049

[5]

CAMPANA JE, UNPUB

[6] HIGH-PERFORMANCE SECONDARY ION MASS-SPECTROMETER [J].

COLTON, RJ ;

CAMPANA, JE ;

BARLAK, TM ;

DECORPO, JJ ;

WYATT, JR .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (12) :1685-1689

[7] MOLECULAR SECONDARY ION MASS-SPECTROMETRY (SIMS) [J].

COLTON, RJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03) :737-747

[8]

DUNLAP BI, 1982, SURF SCI, V121

[9]

ENS W, UNPUB

[10] SIMS MOLECULAR CLUSTER INTENSITIES OF INORGANIC SALTS CONTAINING SULFUR AND NITROGEN OXYANIONS [J].

GANJEI, JD ;

COLTON, RJ ;

MURDAY, JS .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 37 (01) :49-65

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