ACOUSTIC-EMISSION AND PRECISION FORCE-DISPLACEMENT OBSERVATIONS OF SPHERICAL INDENTATIONS INTO TIN FILMS ON SILICON

被引:21
作者
SHIWA, M
WEPPELMANN, ER
BENDELI, A
SWAIN, MV
MUNZ, D
KISHI, T
机构
[1] UNIV KARLSRUHE,INST ZUVERLASSIGKEIT & SCHADENSKUNDE MASCHINE,W-7500 KARLSRUHE,GERMANY
[2] CSIRO,DIV APPL PHYS,LINDFIELD,NSW 2070,AUSTRALIA
关键词
D O I
10.1016/0257-8972(94)90223-2
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Simultaneous measurements have been recorded of the force, displacement and acoustic emission (AE) events during the loading and unloading of a spherical indenter onto a PVD 2.7 mu TiN film on silicon. The AE events were able to detect the onset of film cracking during loading and film delamination during unloading. The measured data are also compared with scanning electron microscopy (SEM) cross-sectional observations of the indented region. Excellent agreement between AE, force-displacement and SEM observations is found.
引用
收藏
页码:598 / 602
页数:5
相关论文
共 9 条
[1]  
BELL TJ, 1991, METROLOGIA, V28, P463
[2]   FINITE-ELEMENT ANALYSIS OF THE CONTACT STRESSES IN AN ELASTIC COATING ON AN ELASTIC SUBSTRATE [J].
DJABELLA, H ;
ARNELL, RD .
THIN SOLID FILMS, 1992, 213 (02) :205-219
[3]  
FIELD JS, 1993, J MATER RES, V8, P137
[4]   ION-BEAM-DEPOSITED FILMS PRODUCED BY FILTERED ARC EVAPORATION [J].
MARTIN, PJ ;
NETTERFIELD, RP ;
KINDER, TJ .
THIN SOLID FILMS, 1990, 193 (1-2) :77-83
[5]  
SHIWA M, 1992, MATER EVAL, V868
[6]  
SHIWA M, IN PRESS
[7]  
WEIHS TP, 1992, MATER RES SOC SYMP P, V239, P361
[8]   OBSERVATION, ANALYSIS, AND SIMULATION OF THE HYSTERESIS OF SILICON USING ULTRA-MICRO-INDENTATION WITH SPHERICAL INDENTERS [J].
WEPPELMANN, ER ;
FIELD, JS ;
SWAIN, MV .
JOURNAL OF MATERIALS RESEARCH, 1993, 8 (04) :830-840
[9]  
WEPPELMANN ER, 1994, INT J ADHESION SCI T, V8, P611